A Sub-Electron-Noise Multi-Channel Cryogenic Skipper-CCD Readout ASIC - INSPIRE

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A Sub-Electron-Noise Multi-Channel Cryogenic Skipper-CCD Readout ASIC

Apr 13, 2023

11 pages

Published in:

IEEE Trans.Circ.Syst. 70 (2023) 6, 2306-2316

Published: Apr 13, 2023

e-Print:

2304.13088 [physics.app-ph]

DOI:

10.1109/TCSI.2023.3256860

Report number:

FERMILAB-PUB-22-743-PPD-SCD

View in:

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Abstract: (IEEE)

The MIDNA application specific integrated circuit (ASIC) is a skipper-CCD readout chip fabricated in a 65nm LP-CMOS process that is capable of working at cryogenic temperatures. The chip integrates four front-end channels that process the skipper-CCD signal and performs differential averaging using a dual slope integration (DSI) circuit. Each readout channel contains a pre-amplifier, a DC restorer, and a dual-slope integrator with chopping capability. The integrator chopping is a key system design element in order to mitigate the effect of low-frequency noise produced by the integrator itself, and it is not often required with standard CCDs. Each channel consumes 4.5 mW of power, occupies 0.156 mm 2 area and has an input referred noise of 2.7

\mu \text {V}_{\text {rms}}

. It is demonstrated experimentally to achieve sub-electron noise when coupled with a skipper-CCD by means of averaging samples of each pixel. Sub-electron noise is shown in three different acquisition approaches. The signal range is 6000 electrons. The readout system achieves 0.2

{\text {e}^{-}}

RMS by averaging 1000 samples with MIDNA both at room temperature and at 180Kelvin.

Charge coupled devices
Voltage
Preamplifiers
Resistors
1/f noise
Cryogenics
Transfer functions
application specific integrated circuits
biomedical electronics
CMOS integrated circuits

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