Unraveling Fano noise and the partial-charge-collection effect in x-ray spectra below 1 keV - INSPIRE

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Unraveling Fano noise and the partial-charge-collection effect in x-ray spectra below 1 keV

Dario Rodrigues
(
- Buenos Aires U. and
- Buenos Aires, CONICET
)
,
Mariano Cababie
(
- Buenos Aires U.
)
,
Ignacio Gomez Florenciano
(
- Buenos Aires U.
)
,
Ana Botti
(
- Fermilab
)
,
Juan Estrada
(
- Fermilab
)

May 15, 2023

8 pages

Published in:

Phys.Rev.Applied 20 (2023) 5, 054014

Published: Nov 1, 2023

e-Print:

2305.09005 [physics.ins-det]

DOI:

10.1103/PhysRevApplied.20.054014 (publication)

Report number:

FERMILAB-PUB-23-247-PPD

View in:

reference search6 citations

Citations per year

Abstract: (APS)

Fano noise, readout noise, and the partial-charge-collection (PCC) effect collectively contribute to the degradation of energy spectra in charge-coupled device (CCD) measurements, especially at low energies. In this work, the x rays produced by the fluorescence of fluorine (677 eV) and aluminum (1486 eV) were recorded using a Skipper-CCD, which enabled the readout noise to be reduced to

0.2 e^{-}

. Based on an analytical description of photopeak shapes resulting from the convolution of the PCC effect and Fano noise, we achieved a precise characterization of the energy spectra. This description enabled us to disentangle and quantify the contributions from both Fano noise and the PCC effect. As a result, we determined the Fano factor and the electron-hole pair creation energy. Additionally, we estimated the PCC region of the sensor and, for the first time, experimentally observed the expected skewness of photopeaks at low energies.

Note:

8 pages, 5 figures

References(26)

Figures(5)

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