andM. Miettinen, RHEL report RPP/T/37 (1972) and C. 'Ilan, University of California, San Diego, Preprint UCSD
W.R. Frazer
,
R.D. Peccei
,
S.S. Pinsky
[2]
IO-113 (1972)
C. Quigg
,
J.D. Jackson
[2]
NAL 'rHY-93 (1972) CERN TIL 1581 (1972). -6
L. Van Hove
[3]
~ Phys. Rev. Lett. 29~ 1688 (1972). 2
J.W. Chapman
[7]
Proponents of nova-type of models, in particular, would argue that our measurement of diffraction production may represent only a lower limit for the process. See for exa.mple the discussion of in the Yale Report No. 3075-18 (1972)