Operational Use of Ionization Profile Monitors in the Fermilab Main Injector

Mar, 2011
3 pages
Published in:
  • Conf.Proc.C 110328 (2011) 519-521
e-Print:
Report number:
  • PAC-2011-MOP222,
  • FERMILAB-CONF-11-010-AD

Citations per year

202020212022202310
Abstract: (arXiv)
Ionization profile monitors (IPMs) are used in the Fermilab Main Injector (MI) to monitor injection lattice matching by measuring turn-by-turn sigmas at injection and to measure transverse emittance of the beam during the acceleration cycle. The IPMs provide a periodic, non-destructive means of performing turn-by-turn emittance measurements where other techniques are not applicable. As Fermilab is refocusing its attention on the intensity frontier, non-intercepting diagnostics such as IPMs are expected to become even more important. This paper gives an overview of the operational use of IPMs for emittance measurements and injection lattice matching measurements at Fermilab, and summarizes the future plans.
Note:
  • 3 pp. Particle Accelerator, 24th Conference (PAC'11) 2011. 28 Mar - 1 Apr 2011. New York, USA
  • injection
  • ionization
  • lattice
  • acceleration
  • accelerator
  • transverse
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