Metrology and 1/f noise: linear regressions and confidence intervals in flicker noise context

1/f noise is very common but is difficult to handle in a metrological way. After having recalled the main characteristics of a strongly correlated noise, this paper will determine relationships giving confidence intervals over the arithmetic mean and the linear drift parameters. A complete example of processing of an actual measurement sequence affected by 1/f noise will be given.

References(32)

Figures(15)

(a) Does this sequence exhibit a linear trend?

(b) If not, what is the confidence interval over the mean delay estimation?

(a) N = 720:

C0 = 9 801 008.73 ± 0.61 ps @ 95%

C1 = 1.29 ± 2.44 ps d-1 @ 95%

D = 9 801 009.05 ± 0.19 ps @ 95%

(b) N = 216:

C0 = 9 801 008.77 ± 0.72 ps @ 95%

C1 = 1.31 ± 2.86 ps d @ 95%

D = 9 801 009.09 ± 0.22 ps @ 95%

(c) N = 72:

C0 = 9 801 008.65 ± 0.83 ps @ 95%

C1 = 1.79 ± 3.29 ps d @ 95%

D = 9 801 009.09 ± 0.24 ps @ 95%

(d) N = 20:

C0 = 9 801 008.72 ± 1.12 ps @ 95%

C1 = 1.44 ± 4.48 ps d @ 95%

D = 9 801 009.07 ± 0.31 ps @ 95%

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