Measurements of timing resolution of ultra-fast silicon detectors with the SAMPIC waveform digitizer - INSPIRE

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Measurements of timing resolution of ultra-fast silicon detectors with the SAMPIC waveform digitizer

Dominique Breton
(
- Orsay, LAL
)
,
Victor De Cacqueray
(
- IRFU, Saclay
)
,
Éric Delagnes
(
- IRFU, Saclay and
- DSM, DAPNIA, Saclay
)
,
Hervé Grabas
(
- UC, Santa Cruz, Inst. Part. Phys.
)
,
Jihane Maalmi
(
- Orsay, LAL
)

Apr 8, 2016

10 pages

Published in:

Nucl.Instrum.Meth.A 835 (2016) 51-60

Published: Nov 1, 2016

e-Print:

1604.02385 [physics.ins-det]

DOI:

10.1016/j.nima.2016.08.019

View in:

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Abstract: (Elsevier)

The SAMpler for PICosecond time (SAMPIC) chip has been designed by a collaboration including CEA/IRFU/SEDI, Saclay and CNRS/LAL/SERDI, Orsay. It benefits from both the quick response of a time to digital converter and the versatility of a waveform digitizer to perform accurate timing measurements. Thanks to the sampled signals, smart algorithms making best use of the pulse shape can be used to improve time resolution. A software framework has been developed to analyse the SAMPIC output data and extract timing information by using either a constant fraction discriminator or a fast cross-correlation algorithm. SAMPIC timing capabilities together with the software framework have been tested using pulses generated by a signal generator or by a silicon detector illuminated by a pulsed infrared laser. Under these ideal experimental conditions, the SAMPIC chip has proven to be capable of timing resolutions down to 4 ps with synthesized signals and 40 ps with silicon detector signals.

Note:

31 pages, 15 figures, accepted by Nuclear Inst. and Methods in Physics Research, A

ASIC
Time-of-flight
Time to digital converter
Waveform sampling
Time resolution
Silicon detector
semiconductor detector
time-to-digital converter
programming
time resolution

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