The maximum a posteriori probability rule for atom column detection from HAADF STEM images

Fatermans, J.; Van Aert, S.; den Dekker, A.J.

doi:10.1016/j.ultramic.2019.02.003

The maximum a posteriori probability rule for atom column detection from HAADF STEM images

Feb 15, 2019

11 pages

Published in:

Ultramicroscopy 201 (2019) 81-91

Published: Jun, 2019

e-Print:

1902.05809 [physics.data-an]

DOI:

10.1016/j.ultramic.2019.02.003 (publication)

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Abstract: (Elsevier)

• The MAP probability rule allows to detect atoms from STEM images in an objective manner. • Approximate analytical expressions for the MAP probability are derived. • Relation between atom detectability and image quality is evaluated. • Atom detection performance is compared to other model-selection methods. • Prior knowledge can be included in a clear and flexible way.

Scanning transmission electron microscopy (STEM)
Atom detection
Atom detectability
Model selection

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