An instrument for precision controlled radiation exposures, charged beam profile measurement, and real-time fluence monitoring beyond n/cm
May 14, 2020
12 pages
Published in:
- JINST 15 (2020) 05, P05024
- Published: May 29, 2020
e-Print:
- 2005.06908 [physics.ins-det]
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Abstract: (IOP)
An instrument has been developed for precision controlled exposures of electronic devices and material samples in particle beams. The instrument provides simultaneously a real time record of the profile of the beam and the fluence received. The system is capable of treating devices with dimensional scales ranging from millimeters to extended objects of cross sections measured in tens of square centimeters. The instrument has been demonstrated to operate effectively in integrated fluences ranging up to a few times 1-MeV-neutron-equivalent/cm (n). The positioner portion of the system comprises a set of remotely controllable sample holders incorporating cooling and interfaces for sample power and readout, all constructed from low activation technologies. The monitoring component of the system samples the current or voltage of radiation tolerant silicon diodes placed directly in the path of the beam.- Beam-line instrumentation (beam position and profile monitors
- beam-intensity mon-itors; bunch length monitors)
- Dosimetry concepts and apparatus
- monitoring
- beam profile
- irradiation
- detector: design
- semiconductor detector
- experimental equipment
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