Improving the temporal resolution of event-based electron detectors using neural network cluster analysis
Jul 31, 20238 pages
Published in:
- Ultramicroscopy 256 (2024) 113881
- Published: Nov 11, 2023
e-Print:
- 2307.16666 [physics.ins-det]
DOI:
- 10.1016/j.ultramic.2023.113881 (publication)
View in:
Citations per year
Abstract: (Elsevier B.V.)
•Neural network cluster analysis enhances temporal accuracy of event-based electron detectors.•Correlations within event clusters triggered by incident electrons are leveraged to improve timing precision.•A neural network is trained by experimental fs-electron pulse data.•The proposed method achieves a 2 ns rms temporal resolution, significantly narrowing the timing distribution. Novel event-based electron detector platforms provide an avenue to extend the temporal resolution of electron microscopy into the ultrafast domain. Here, we characterize the timing accuracy of a detector based on a TimePix3 architecture using femtosecond electron pulse trains as a reference. With a large dataset of event clusters triggered by individual incident electrons, a neural network is trained to predict the electron arrival time. Corrected timings of event clusters show a temporal resolution of 2 ns, a 1.6-fold improvement over cluster-averaged timings. This method is applicable to other fast electron detectors down to sub-nanosecond temporal resolutions, offering a promising solution to enhance the precision of electron timing for various electron microscopy applications.Note:
- 8 pages, 3 figures
- Ultrafast transmission electron microscopy
- Event-based electron detectors
- Neural network
- Cluster analysis
- Femtosecond electron pulses
References(28)
Figures(0)
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