Noise discrimination method based on charge distribution of CMOS detectors for soft X-ray

Fang, Xinchao; Cang, Jirong; Wu, Qiong; Feng, Hua; Zeng, Ming

Noise discrimination method based on charge distribution of CMOS detectors for soft X-ray

Nov 13, 2023

19 pages

e-Print:

2311.07844 [astro-ph.IM]

View in:

ADS Abstract Service

pdf

reference search0 citations

Citations per year

0 Citations

Abstract: (arXiv)

Complementary metal-oxide semiconductor (CMOS) sensors have been widely used as soft X-ray detectors in several fields owing to their recent developments and unique advantages. The parameters of CMOS detectors have been extensively studied and evaluated. However, the key parameter signal-to-noise ratio in certain fields has not been sufficiently studied. In this study, we analysed the charge distribution of the CMOS detector GSENSE2020BSI and proposed a two-dimensional segmentation method to discriminate signals according to the charge distribution. The effect of the two-dimensional segmentation method on the GSENSE2020BSI dectector was qualitatively evaluated. The optimal feature parameters used in the two-dimensional segmentation method was studied for G2020BSI. However, the two-dimensional segmentation method is insensitive to feature parameters.

Note:

19 pages, 13 figures, submitted to NIM-A

References(18)

Figures(14)

[1]

Energy- and spatial-resolved detection using a backsideilluminated cmos sensor in the soft x-ray region, Applied Physics Express 12 082012

T. Harada
,
N. Teranishi
,
T. Watanabe
,
Q. Zhou
,
X. Yang

et al.

•
DOI:
- 10.7567/1882-0786/ab32d2

[2]

High-exposure-durability, high-quantum-efficiency (> 90%) backsideilluminated soft-x-ray cmos sensor, Applied Physics Express 13 016502

T. Harada
,
N. Teranishi
,
T. Watanabe
,
Q. Zhou
,
J. Bogaerts

et al.

•
DOI:
- 10.7567/1882-0786/ab5b5e

[3]

Custom highsensitivity CCD and sCMOS detectors for high-harmonic generation, x-ray absorption spectroscopy, soft x-ray microscopy/tomography, and hard x-ray detection 56

J.T. Cooper
,
A.J. Wise
,
T. Woodward
,
A. Varagnat

•
DOI:
- 10.1117/12.2546096

[4]

Backside-illuminated scientific CMOS detector for soft X-ray resonant scattering and ptychography, Journal of Synchrotron Radiation 12 Figure 10: The two-dimensional distribution of the center pixel value vs. the second plus third largest pixel total value for events in the mixed data set.The red line is the segmentation line y = -0.85x + 70.1. The events at the bottom left of the segmentation line are recognized as noise and the events at the top right of the segmentation line are recognized as signals. 27 1577-1589

K. Desjardins
,
K. Medjoubi
,
M. Sacchi
,
H. Popescu
,
R. Gaudemer

et al.

•
DOI:
- 10.1107/S160057752001262X

[5]

High-speed X-ray imaging spectroscopy system with Zynq SoC for solar observations

et al.

- Nucl.Instrum.Meth.A 912 (2018) 191-194
•
e-Print:
- 1711.04372
•
DOI:
- 10.1016/j.nima.2017.11.033

[10]

On understanding the figures of merit for detection and measurement of x-ray polarization

- Proc.SPIE Int.Soc.Opt.Eng. 7732 (2010) 77320E
•
e-Print:
- 1006.3711
•
DOI:
- 10.1117/12.857357

[7]

S. nosuke Ishikawa, T. Sakao, X

N. Narukage

[8]

Improving the X-Ray Energy Resolution of a Scientific CMOS Detector by Pixel-level Gain Correction

et al.

- Publ.Astron.Soc.Pac. 135 (2023) 1044, 025003
•
e-Print:
- 2303.01027
•
DOI:
- 10.1088/1538-3873/acbcf3

[9]

Investigating the image lag of a scientific CMOS sensor in X-ray detection

et al.

- Nucl.Instrum.Meth.A 1050 (2023) 168180
•
e-Print:
- 2303.08425
•
DOI:
- 10.1016/j.nima.2023.168180

[10]

On understanding the figures of merit for detection and measurement of x-ray polarization

- Proc.SPIE Int.Soc.Opt.Eng. 7732 (2010) 77320E
•
e-Print:
- 1006.3711
•
DOI:
- 10.1117/12.857357

[11]

Performance verification of next-generation Si CMOS soft X-ray detector for space applications

et al.

- Nucl.Instrum.Meth.A 987 (2021) 164843
•
DOI:
- 10.1016/j.nima.2020.164843

[12]

Performance of a focal plane detector for soft X-ray imaging spectroscopy based on back-illuminated sCMOS

et al.

- Nucl.Instrum.Meth.A 1030 (2022) 166465
•
e-Print:
- 2111.11610
•
DOI:
- 10.1016/j.nima.2022.166465

[13]

Ptychography at the carbon k-edge

N. Mille
,
H. Yuan
,
J. Vijayakumar
,
S. Stanescu
,
S. Swaraj

et al.

- Commun.Mater. 3 (2022) 8
•
DOI:
- 10.1038/s43246-022-00232-8

[14]

MOS-based model of four-transistor CMOS image sensor pixels for photoelectric simulation, Chinese Physics B 31

B. Zhang
,
C. Hu
,
Y. Xin
,
Y. Li
,
Z. Guo

et al.

•
DOI:
- 10.1088/1674-1056/ac3819

[15]

Characterisation of a soft X-ray optimised CMOS 15 Figure 13: The mixedenergy spectrum with different processes. The spectrum shown by blue line is obtained without processing. The spectrum shown by orange line is obtained by subtracting from the noise energy spectrum. The spectrum shown by green line is obtained by two-dimensional segmentation method with TOV as the feature parameter and y = -1.9x + 130 as the segmentation line. Image Sensor, Journal of Instrumentation 17 . doi:10.1088/ 1748-0221/17/05/P05003

J. Heymes
,
J. Ivory
,
K. Stefanov
,
T. Buggey
,
O. Hetherington

et al.

[16]

A 4MP highdynamic-range, low-noise CMOS image sensor, Image Sensors and Imaging Systems9403 940305

C. Ma
,
Y. Liu
,
J. Li
,
Q. Zhou
,
Y. Chang

et al.

•
DOI:
- 10.1117/12.2083085

[17]

Characterization of a BSI sCMOS for soft Xray imaging spectroscopy, Journal of Instrumentation 14 . doi:10. 1088/1748-0221/14/02/P02025

W.X. Wang
,
Z.X. Ling
,
C. Zhang
,
Z.Q. Jia
,
X.Y. Wang

et al.

[18]

A comparison of four different digital algorithms for pulse-shape discrimination in fast scintillators

K. Gamage
,
M. Joyce
,
N. Hawkes

- Nucl.Instrum.Meth.A 642 (2011) 78-83
•
DOI:
- 10.1016/j.nima.2011.03.065