Pulse shape analysis in segmented detectors as a technique for background reduction in ge double-beta decay experiments
Sep, 2005
12 pages
Published in:
- Nucl.Instrum.Meth.A 558 (2006) 504-510
e-Print:
- nucl-ex/0509026 [nucl-ex]
Report number:
- LA-UR-05-6083
Citations per year
Abstract:
The need to understand and reject backgrounds in Ge-diode detector double-beta decay experiments has given rise to the development of pulse shape analysis in such detectors to discern single-site energy deposits from multiple-site deposits. Here, we extend this analysis to segmented Ge detectors to study the effectiveness of combining segmentation with pulse shape analysis to identify the multiplicity of the energy deposits.- 29.40.Wk
- 23.40.-s
- (76)Ge
- Neutrinoless double-beta decay
- Ge detectors
- Pulse shape analysis
- Segmentation
- double-beta decay: (0neutrino)
- semiconductor detector: germanium
- background
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