Ion backflow in thick GEM-based detectors of single photons - INSPIRE

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Ion backflow in thick GEM-based detectors of single photons

M. Alexeev
(
- INFN, Trieste
)
,
R. Birsa
(
- INFN, Trieste
)
,
F. Bradamante
(
- INFN, Trieste and
- Trieste U.
)
,
A. Bressan
(
- INFN, Trieste and
- Trieste U.
)
,
M. Chiosso
(
- INFN, Turin and
- Turin U.
)

2013

Published in:

JINST 8 (2013) P01021

DOI:

10.1088/1748-0221/8/01/P01021

Experiments:

CERN-SPS-NA58

reference search36 citations

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Abstract: (IOP)

Photon detectors based on micropattern gas detectors represent a new generation of gaseous photon detectors. In the context of a project to upgrade the gas photon detectors of COMPASS RICH-1, we are performing an R&D programme aimed both to establish the principles and to develop the engineering aspects of photon detectors based on multi-layer arrangements of thick GEMs electron multipliers coupled to a CsI photoconverter. In this context, a reduced rate of the backflow of the positive ions generated in the multiplication process is required to overcome the critical issues related to the bombardment of the CsI photoconverter by ions. Our studies devoted to develop detector architectures able to provide reduced ion backflow rates are reported.

photon: detector
cesium: iodine
ion
flow
gas electron multiplier
engineering
COMPASS
detector: design

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Figures(0)

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