Structural and Magnetic Depth Profile Analysis of L10 FeNi Film by Polarized Neutron Reflectometry

We performed structural and magnetic-depth profile analysis on a multilayer sample with an FeNi layer using polarized neutron reflectometry. Neutron polarization-dependent reflectivity was measured and significant contrast in the scattering length density in the FeNi layer was found. Layer thicknesses, interface roughnesses, and magnetic moments for each layer were evaluated. We have successfully determined the magnetic moment in the FeNi layer separately from the buffer and the seed layers with magnetic atoms.

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