Variational-state quantum metrology

Koczor, B.álint; Endo, Suguru; Jones, Tyson; Matsuzaki, Yuichiro; Benjamin, Simon C.

doi:10.1088/1367-2630/ab965e

Variational-state quantum metrology

B.álint Koczor
(
- U. Oxford (main)
)
,
Suguru Endo
(
- U. Oxford (main)
)
,
Tyson Jones
(
- U. Oxford (main)
)
,
Yuichiro Matsuzaki
(
- AIST, Tsukuba
)
,
Simon C. Benjamin
(
- U. Oxford (main)
)

Aug 23, 2019

31 pages

Published in:

New J.Phys. 22 (2020) 8, 083038

Published: Aug 20, 2020

e-Print:

1908.08904 [quant-ph]

DOI:

10.1088/1367-2630/ab965e

View in:

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Abstract: (IOP)

Quantum technologies exploit entanglement to enhance various tasks beyond their classical limits including computation, communication and measurements. Quantum metrology aims to increase the precision of a measured quantity that is estimated in the presence of statistical errors using entangled quantum states. We present a novel approach for finding (near) optimal states for metrology in the presence of noise, using variational techniques as a tool for efficiently searching the high-dimensional space of quantum states, which would be classically intractable. We comprehensively explore systems consisting of up to 9 qubits and find new highly entangled states that are not symmetric under permutations and non-trivially outperform previously known states up to a constant factor 2. We consider a range of environmental noise models; while passive quantum states cannot achieve a fundamentally superior scaling (as established by prior asymptotic results) we do observe a significant absolute quantum advantage. We finally outline a possible experimental setup for variational quantum metrology which can be implemented in near-term hardware.

Note:

31 pages, 10 figures -- added more discussion about, e.g., the optimisation and the ansatz structure

approximation: classical
error: statistical
quantum state
entanglement
noise
variational
hardware
scaling
qubit

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