Abstract: (Elsevier)
We present the results of final acceptance tests of the DELPHI VFT ministrip detector before and during detector assembly. Dedicated tests were carried out to detect substandard channels, measure the S N performance and test the assembled detector for electronic failures.
  • talk: Novosibirsk 1996/02/29
  • tracks
  • small-angle
  • semiconductor detector: microstrip
  • upgrade
  • acceptance
  • electronics: background
  • DELPHI
  • CERN LEP Stor