Development of uniform CdTe pixel detectors based on Caltech ASIC
- Kousuke Oonuki(,)
- JAXA, Sagamihara and
- Tokyo U. and
- Caltech
- Hokuto Inoue(,)
- JAXA, Sagamihara and
- Tokyo U. and
- Caltech
- Kazuhiro Nakazawa(,)
- JAXA, Sagamihara and
- Tokyo U. and
- Caltech
- Takefumi Mitani(,)
- JAXA, Sagamihara and
- Tokyo U. and
- Caltech
- Takaaki Tanaka()
- JAXA, Sagamihara and
- Tokyo U. and
- Caltech
11 pages
Published in:
- Proc.SPIE Int.Soc.Opt.Eng. 5501 (2004) 218
Contribution to:
e-Print:
- astro-ph/0410040 [astro-ph]
DOI:
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Abstract: (arXiv)
We have developed a large CdTe pixel detector with dimensions of 23.7 x 13.0 mm and a pixel size of 448 x 448 um^2. The detector is based on recent technologies of an uniform CdTe single crystal, a two-dimensional ASIC, and stud bump-bonding to connect pixel electrodes on the CdTe surface to the ASIC. Good spectra are obtained from 1051 pixels out of total 1056 pixels. When we operate the detector at -50 C, the energy resolution is 0.67 keV and 0.99 keV at 14 keV and 60 keV, respectively. Week-long stability of the detector is confirmed at operating temperatures of both -50 C and -20 C. The detector also shows high uniformity: the peak positions for all pixels agree to within 0.82%, and the average of the energy resolution is 1.04 keV at a temperature of -50 C. When we normalized the peak area by the total counts detected by each pixel, a variation of 2.1 % is obtained.- CZT
- HARD X-RAY DETECTOR
- STUD BUMP BONDING
- IMAGING SPECTROMETER
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