Sub-wavelength surface IR imaging of soft-condensed matter

Oct, 2010
21 pages
Published in:
  • Eur.Phys.J.Appl.Phys. 51 (2010) 1202
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Abstract: (arXiv)
Outlined here is a technique for sub-wavelength infrared surface imaging performed using a phase matched optical parametric oscillator laser and an atomic force microscope as the detection mechanism. The technique uses a novel surface excitation illumination approach to perform simultaneously chemical mapping and AFM topography imaging with an image resolution of 200 nm. This method was demonstrated by imaging polystyrene micro-structures.
      • Science 251 1468
      • J.Vac.Sci.Technol.A 6 271
      • Appl.Spectrosc. 53 810
      • Spectrosc. 19 20
      • Infrared Phys.Tech. 49 113
      • Ultramicroscopy 107 1194
      • Phys.Rev.Lett. 99 217404
      • Opt.Lett. 33 1611
      • Opt.Lett. 34 431
      • Opt.Express 16 1529
      • Nano Lett. 7 3177
      • Nano Lett. 6 1307
      • Ultramicroscopy 103 133
      • Ultramicroscopy 101 47
      • Opt.Lett. 28 441
      • Rev.Sci.Instrum. 78 013705
      • Appl.Phys.B 70 237
      • J.Math.Sci. 22 2079
      • Polymer 41 1