Inner tracking devices at the Belle II experiment

Nov 2, 2015
6 pages
Published in:
  • PoS EPS-HEP2015 (2015) 255
Contribution to:
  • Published: Nov 2, 2015 by SISSA

Citations per year

20162017201810
Abstract:
In the future Belle II experiment at the SuperKEKB collider in Tsukuba, Japan, charged particle tracking in the vicinity of the e+ e− interaction point is provided by a two-layer silicon pixel detector based on the novel DEPFET technology (PXD) and by a four-layer silicon strip detector (SVD). In this presentation, I review the technology and the design of these two devices, and describe the current state of their construction.
  • activity report
  • semiconductor detector: technology
  • semiconductor detector: microstrip
  • semiconductor detector: pixel
  • semiconductor detector: design
  • BELLE
  • upgrade