Inner tracking devices at the Belle II experiment
Nov 2, 20156 pages
Published in:
- PoS EPS-HEP2015 (2015) 255
Contribution to:
- , 255
- EPS-HEP 2015
- Published: Nov 2, 2015 by SISSA
DOI:
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Abstract:
In the future Belle II experiment at the SuperKEKB collider in Tsukuba, Japan, charged particle tracking in the vicinity of the e+ e− interaction point is provided by a two-layer silicon pixel detector based on the novel DEPFET technology (PXD) and by a four-layer silicon strip detector (SVD). In this presentation, I review the technology and the design of these two devices, and describe the current state of their construction.- activity report
- semiconductor detector: technology
- semiconductor detector: microstrip
- semiconductor detector: pixel
- semiconductor detector: design
- BELLE
- upgrade
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