Beam Test Results of the BTeV Silicon Pixel Detector - INSPIRE

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Beam Test Results of the BTeV Silicon Pixel Detector

BTeV

Collaboration

•

G. Chiodini

Jun, 2000

8 pages

Part of Proceedings, 1st International Workshop on Seminconductor Pixel Detectors for Particles and X-Rays (PIXEL 2000) : Genoa, Italy, June 5-8, 2000

Published in:

Nucl.Instrum.Meth.A 465 (2000) 125-130

Contribution to:

- PIXEL 2000

e-Print:

hep-ex/0009023 [hep-ex]

DOI:

10.1016/S0168-9002(01)00369-2

Report number:

FERMILAB-CONF-00-219-E

View in:

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Abstract: (arXiv)

The results of the BTeV silicon pixel detector beam test carried out at Fermilab in 1999-2000 are reported. The pixel detector spatial resolution has been studied as a function of track inclination, sensor bias, and readout threshold.

talk: Genova 2000/06/05
semiconductor detector: vertex
semiconductor detector: pixel
spatial resolution
electronics: readout
integrated circuit
magnetic spectrometer: BTeV
Batavia TEVATRON Coll

References(7)

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