Towards Gotthard-II: Development of A Silicon Microstrip Detector for the European X-ray Free-Electron Laser

Nov 20, 2017
22 pages
Published in:
  • JINST 13 (2018) 01, P01025
  • Published: Jan 26, 2018
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Abstract: (IOP)
Gotthard-II is a 1-D microstrip detector specifically developed for the European X-ray Free-Electron Laser. It will not only be used in energy dispersive experiments but also as a beam diagnostic tool with additional logic to generate veto signals for the other 2-D detectors. Gotthard-II makes use of a silicon microstrip sensor with a pitch of either 50 μm or 25 μm and with 1280 or 2560 channels wire-bonded to adaptive gain switching readout chips. Built-in analog-to-digital converters and digital memories will be implemented in the readout chip for a continuous conversion and storage of frames for all bunches in the bunch train. The performance of analogue front-end prototypes of Gotthard has been investigated in this work. The results in terms of noise, conversion gain, dynamic range, obtained by means of infrared laser and X-rays, will be shown. In particular, the effects of the strip-to-strip coupling are studied in detail and it is found that the reduction of the coupling effects is one of the key factors for the development of the analogue front-end of Gotthard-II.
Note:
  • 22 pages, 26 figures
  • Instrumentation for FEL
  • Radiation-hard detectors
  • X-ray detectors