Nuclear recoil identification in a scientific charge-coupled device - INSPIRE

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Nuclear recoil identification in a scientific charge-coupled device

K.J. McGuire
(
- CENPA, Seattle
)
,
A.E. Chavarria
(
- CENPA, Seattle
)
,
N. Castello-Mor
(
- Cantabria Inst. of Phys.
)
,
S. Lee
(
- Zurich U.
)
,
B. Kilminster
(
- Zurich U.
)

Sep 14, 2023

9 pages

Published in:

Phys.Rev.D 110 (2024) 4, 043008

Published: Aug 2, 2024

e-Print:

2309.07869 [physics.ins-det]

DOI:

10.1103/PhysRevD.110.043008 (publication)

View in:

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Abstract: (APS)

Charge-coupled devices (CCDs) are a leading technology in direct searches for dark matter because of their eV-scale energy threshold and micrometer-scale spatial resolution. Recent studies have also highlighted the potential for using CCDs to detect coherent elastic neutrino-nucleus scattering. The sensitivity of future CCD experiments could be enhanced by distinguishing nuclear recoil signals from electronic recoil backgrounds in the CCD silicon target. We present a technique for event-by-event identification of nuclear recoils based on the spatial correlation between the primary ionization event and the defect cluster left behind by the recoiling atom, later identified as a localized excess of leakage current under thermal stimulation. By irradiating a CCD with an

{}^{241}{Am} {}^{9}{Be}

neutron source, we demonstrate

> 93 %

identification efficiency for nuclear recoils with energies

> 150 keV

, where the coincident ionization events were confirmed to be nuclear recoils due to their topology. The technique remains fully efficient down to 90 keV, decreasing to 50% at 8 keV and reaching

(6 \pm 2) %

between 1.5 and 3.5 keV. Irradiation with a

{}^{24}{Na}

gamma-ray source does not result in any detectable defect clusters, with the fraction of electronic recoils with energies

< 85 keV

that are spatially correlated with defects

< 0.1 %

.

Note:

9 pages, 7 figures

nucleus: recoil
energy: threshold
CCD
crystal: defect
ionization
n: irradiation
gamma ray: irradiation
dark matter: direct detection
sensitivity
correlation

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